![](\"http:\/\/journals.khnu.km.ua\/vestnik\/wp-content\/uploads\/2021\/01\/pdf.png\")
<\/a> \u0421\u0442\u043e\u0440\u0456\u043d\u043a\u0438: 99-101. \u041d\u043e\u043c\u0435\u0440: \u21162, 2019 (271)<\/strong>\n\u0410\u0432\u0442\u043e\u0440\u0438:<\/strong>
\n\u0420. \u041b. \u0413\u0410\u0412\u0420\u0418\u041b\u042e\u041a, \u0420. \u0412. \u041a\u0420\u0410\u0412\u0427\u0423\u041a, \u0412. \u041e. \u0424\u0415\u0420\u0415\u041d\u0421, \u0412. \u041c. \u0427\u0415\u0428\u0423\u041d
\n\u0425\u043c\u0435\u043b\u044c\u043d\u0438\u0446\u044c\u043a\u0438\u0439 \u043d\u0430\u0446\u0456\u043e\u043d\u0430\u043b\u044c\u043d\u0438\u0439 \u0443\u043d\u0456\u0432\u0435\u0440\u0441\u0438\u0442\u0435\u0442
\nR. L. HAVRYLIUK, R. V. KRAVCHUK, V. O. FERENS, V. M. CHESHUN
\nKhmelnytskyi National University
\nDOI:<\/strong> https:\/\/www.doi.org\/10.31891\/2307-5732-2019-271-2-99-101<\/a>
\n\u0420\u0435\u0446\u0435\u043d\u0437\u0456\u044f\/Peer review :<\/strong> 24.02.2019 \u0440.
\n\u041d\u0430\u0434\u0440\u0443\u043a\u043e\u0432\u0430\u043d\u0430\/Printed :<\/strong> 10.04.2019 \u0440.<\/p>\n
\u0410\u043d\u043e\u0442\u0430\u0446\u0456\u044f \u043c\u043e\u0432\u043e\u044e \u043e\u0440\u0438\u0433\u0456\u043d\u0430\u043b\u0443<\/strong><\/p>\n \u0412 \u0440\u043e\u0431\u043e\u0442\u0456 \u043d\u0430\u0432\u0435\u0434\u0435\u043d\u043e \u043e\u043f\u0438\u0441 \u043c\u0430\u0442\u0435\u043c\u0430\u0442\u0438\u0447\u043d\u043e\u0457 \u043c\u043e\u0434\u0435\u043b\u0456 \u0434\u043b\u044f \u043e\u0440\u0433\u0430\u043d\u0456\u0437\u0430\u0446\u0456\u0457 \u0442\u0435\u0441\u0442\u043e\u0432\u043e\u0433\u043e \u0434\u0456\u0430\u0433\u043d\u043e\u0441\u0442\u0443\u0432\u0430\u043d\u043d\u044f \u0441\u0445\u0435\u043c \u043e\u043f\u0435\u0440\u0430\u0442\u0438\u0432\u043d\u043e\u0457 \u043f\u0430\u043c\u2019\u044f\u0442\u0456 \u0437 \u0434\u043e\u0432\u0456\u043b\u044c\u043d\u0438\u043c \u0434\u043e\u0441\u0442\u0443\u043f\u043e\u043c \u0456\u0437 \u043a\u043e\u043c\u0431\u0456\u043d\u043e\u0432\u0430\u043d\u0438\u043c \u0437\u0430\u0441\u0442\u043e\u0441\u0443\u0432\u0430\u043d\u043d\u044f\u043c \u0442\u0440\u044c\u043e\u0445 \u0442\u0435\u0441\u0442\u0456\u0432 \u0432 \u043f\u0440\u044f\u043c\u0456\u0439 \u0442\u0430 \u0456\u043d\u0432\u0435\u0440\u0441\u043d\u0456\u0439 \u0440\u0435\u0430\u043b\u0456\u0437\u0430\u0446\u0456\u044f\u0445: “\u0448\u0430\u0445\u043e\u0432\u043e\u0433\u043e”, “\u0447\u0435\u0440\u0433\u0443\u0432\u0430\u043d\u043d\u044f \u0440\u044f\u0434\u043a\u0456\u0432 0\/1” \u0456 “\u0447\u0435\u0440\u0433\u0443\u0432\u0430\u043d\u043d\u044f \u0441\u0442\u043e\u0432\u043f\u0446\u0456\u0432 0\/1”. \u0420\u043e\u0437\u0448\u0438\u0440\u0435\u043d\u0430 \u0430\u043d\u043e\u0442\u0430\u0446\u0456\u044f \u0430\u043d\u0433\u043b\u0456\u0439\u0441\u044c\u043a\u043e\u044e \u043c\u043e\u0432\u043e\u044e<\/strong><\/p>\n Increasing the internal complexity of modern discrete electronic components, including random access memory schemes, complicates the process of their verification. This leads to a reduction in the effectiveness of intuitive testing methods and the need for clearly formalized diagnostic methods based on the use of adequate mathematical models. The article describes a mathematical model based on the main provisions of technical diagnostics, the theory of test diagnostics, the theory of sets and matrices. It is designed to create fault models and models of tests in the implementation of combined diagnosis of random access memory schemes with the combined use of basic tests in direct and inverse implementations: test “chess”, test “lines zero\/one” and test “columns zero\/one”.\u00a0 Also, the model can be used to describe other variants of memory schemes tests. The models are based on the use of matrix models of memory schemes and formalized descriptions of operations of access to memory for recording and readings. The proposed mathematical model is intended to adequately reflect the important parameters of the diagnostic experiment, the peculiarities of the tests, ensure predictability and reliability of the results. Referenses<\/strong><\/p>\n \u041c\u0410\u0422\u0415\u041c\u0410\u0422\u0418\u0427\u041d\u0410 \u041c\u041e\u0414\u0415\u041b\u042c \u041f\u0420\u041e\u0426\u0415\u0421\u0423 \u0414\u0406\u0410\u0413\u041d\u041e\u0421\u0422\u0423\u0412\u0410\u041d\u041d\u042f \u0421\u0425\u0415\u041c \u041e\u041f\u0415\u0420\u0410\u0422\u0418\u0412\u041d\u041e\u0407 \u041f\u0410\u041c\u2019\u042f\u0422\u0406 \u0417 \u0414\u041e\u0412\u0406\u041b\u042c\u041d\u0418\u041c \u0414\u041e\u0421\u0422\u0423\u041f\u041e\u041c MATHEMATICAL MODEL FOR THE TEST DIAGNOSTIC PROCESS OF RANDOM ACCESS MEMORY SCHEME \u0421\u0442\u043e\u0440\u0456\u043d\u043a\u0438: 99-101. \u041d\u043e\u043c\u0435\u0440: \u21162, 2019 (271) \u0410\u0432\u0442\u043e\u0440\u0438: \u0420. \u041b. \u0413\u0410\u0412\u0420\u0418\u041b\u042e\u041a, \u0420. \u0412. \u041a\u0420\u0410\u0412\u0427\u0423\u041a, \u0412. \u041e. \u0424\u0415\u0420\u0415\u041d\u0421, \u0412. \u041c. \u0427\u0415\u0428\u0423\u041d \u0425\u043c\u0435\u043b\u044c\u043d\u0438\u0446\u044c\u043a\u0438\u0439 \u043d\u0430\u0446\u0456\u043e\u043d\u0430\u043b\u044c\u043d\u0438\u0439 \u0443\u043d\u0456\u0432\u0435\u0440\u0441\u0438\u0442\u0435\u0442 R. L. HAVRYLIUK, R. V. KRAVCHUK, V. O. FERENS, V. M. […]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[22],"tags":[],"_links":{"self":[{"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/posts\/2135"}],"collection":[{"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=2135"}],"version-history":[{"count":3,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/posts\/2135\/revisions"}],"predecessor-version":[{"id":5291,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=\/wp\/v2\/posts\/2135\/revisions\/5291"}],"wp:attachment":[{"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=2135"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=2135"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/journals.khnu.km.ua\/vestnik\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=2135"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
\n\u041a\u043b\u044e\u0447\u043e\u0432\u0456 \u0441\u043b\u043e\u0432\u0430:<\/strong> \u043c\u0430\u0442\u0435\u043c\u0430\u0442\u0438\u0447\u043d\u0430 \u043c\u043e\u0434\u0435\u043b\u044c, \u043e\u043f\u0435\u0440\u0430\u0442\u0438\u0432\u043d\u0430 \u043f\u0430\u043c\u2019\u044f\u0442\u044c \u0437 \u0434\u043e\u0432\u0456\u043b\u044c\u043d\u0438\u043c \u0434\u043e\u0441\u0442\u0443\u043f\u043e\u043c, \u0442\u0435\u0441\u0442\u043e\u0432\u0435 \u043a\u043e\u043c\u0431\u0456\u043d\u043e\u0432\u0430\u043d\u0435 \u0434\u0456\u0430\u0433\u043d\u043e\u0441\u0442\u0443\u0432\u0430\u043d\u043d\u044f, \u0442\u0435\u0445\u043d\u0456\u0447\u043d\u0430 \u0434\u0456\u0430\u0433\u043d\u043e\u0441\u0442\u0438\u043a\u0430.<\/p>\n
\nKey words:<\/strong> mathematical model, random access memory, combined diagnostic test, technical diagnostics.<\/p>\n\n